![]() ![]() (FR) La présente invention concerne une carte sonde pour un équipement d'essai de dispositifs électroniques, comprenant une plaque de support (23), une membrane souple (24) conçue pour transporter des signaux haute fréquence entre un dispositif à l'essai et la plaque de support (23), ladite membrane souple (24) étant reliée à la plaque de support (23) à travers une zone périphérique (24b), une structure d'amortissement (21) disposée entre la plaque de support (23) et la membrane souple (24) et conçue pour amortir la butée sur le dispositif à l'essai, ainsi qu'une pluralité de microsondes de contact (26) comprenant un corps (26') s'étendant entre une première extrémité (26a) et une seconde extrémité (26b), ladite seconde extrémité (26b) étant conçue pour venir en butée sur des plots de contact (27) du dispositif à l'essai, la structure d'amortissement (21) et les premières extrémités (26a) des micro-sondes de contact (26) étant en contact avec des faces opposées (Fa, Fb) d'une même zone de contact (24a) de la membrane souple (24). Suitably, the flexible membrane (24) includes at least one weakening zone (24c) arranged between the contact zone (24a) and the peripheral zone (24b) and adjacent thereto, said weakening zone (24c) comprising at least one weakening element (28) adapted to mechanically weaken the flexible membrane (24) and to locally increase the deformability thereof. HIGH PERFORMANCE PROBE MANUALThe small probe head geometry and assorted probe tip accessories allow these probes to easily accommodate manual probing of surface mount devices.(EN) A probe card for a test equipment of electronic devices, comprises a support plate (23),a flexible membrane (24) adapted to carry high frequency signals between a device under test and the support plate (23), said flexible membrane (24) being connected to the support plate (23) through a peripheral zone (24b), a damping structure (21) arranged between the support plate (23) and the flexible membrane (24) and adapted to damp the abutment onto the device under test, as well as a plurality of micro contact probes (26) comprising a body (26') extending between a first end (26a) and a second end (26b), said second end (26b) being adapted to abut onto contact pads(27) of the device under test, wherein the damping structure (21) and the first ends (26a) of the micro contact probes(26) are in contact with opposite faces (Fa, Fb) of a same contact zone (24a) of the flexible membrane (24). Whether tracking wires in a clear and quiet location or trying to find a wire in an area roaring with power hum and digital crosstalk, the 200XP probe and 77GX. The P7330 and P6330 provide high-bandwidth, low circuit loading, and low noise differential probing solutions. The P7330 enable users to make time domain or frequency domain measurements on high bandwidth signals commonly found in digital IC designs, communication applications, and disk drive applications. ![]() 7071715: Probe card configuration for low mechanical flexural strength electrical routing substrates: : Shinde. P7330 3.5 GHz Differential Probe for TekConnect Interface. High performance probe system: : Miller: 7227371: High performance probe system: : Miller: 7189077: Lithographic type microelectronic spring structures with improved contours: : Eldridge et al. HIGH PERFORMANCE PROBE SERIESTektronix P7330 High Performance Differential Probe Tektronix P7330 High Performance Differential Probeīack to Tek Probes Summary Page This manual was available from Tektronix for Download Includes belt drive, integrated controls, 2 encoders, reel, spool, cables (Pwr, RJ-45 and 18-pin) and 2 transport. Ruggedized High-Performance Gauging Probe - IN STOCK The ILPS-19S linear position sensor series offer a choice of four analog outputs and all include HGSIs. ![]()
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